Defect inspection method and defect inspection device
Number of patents in Portfolio can not be more than 2000
United States of America
Stats
-
Apr 26, 2022
Grant Date -
Jun 4, 2020
app pub date -
Jul 25, 2018
filing date -
Jul 25, 2018
priority date (Note) -
In Force
status (Latency Note)
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Importance

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Abstract
A defect image including a defect and a defect-free image not including a defect for an article different from an inspection article are acquired to teach an identifier when inspecting for a defect in the inspection article. The identifier that has learned the images is made to identify whether an extracted inspection image obtained by segmenting the inspection image of the inspection article includes the defect and the identification results of the identifier are used to determine whether a defect is present in the inspection article. When teaching the identifier the defect, the identifier is provided with, as learning images, a plurality of extracted defect images generated from the defect image by changing an extracting region for extraction from the defect image such that the defect in the defect image is at a different position in each of the plurality of extracted defect images.
First Claim
all claims..Other Claims data not available
Family
Country | kind | publication No. | Filing Date | Type | Sub-Type |
---|---|---|---|---|---|
JP | B2 | JP7210873 | Jul 26, 2017 | Patent | Grant |
Type : Patent Sub-Type : Grant | |||||
PUBLISHED GRANTED PATENT (SECOND LEVEL) | 欠陥検査方法及び欠陥検査装置 | Jan 24, 2023 | |||
EP | A1 | EP3660491 | Jul 25, 2018 | Patent | Application |
Type : Patent Sub-Type : Application | |||||
APPLICATION PUBLISHED WITH SEARCH REPORT | DEFECT INSPECTING METHOD AND DEFECT INSPECTING DEVICE | Jun 03, 2020 | |||
CN | A | CN110959114 | Jul 25, 2018 | Patent | Application |
Type : Patent Sub-Type : Application | |||||
UNEXAMINED APPLICATION FOR A PATENT FOR INV. | Defect inspection method and defect inspection apparatus | Apr 03, 2020 | |||
WO | A1 | WO2019022170 | Jul 25, 2018 | Patent | Application |
Type : Patent Sub-Type : Application | |||||
INTERNATIONAL APPLICATION PUBLISHED WITH INTERNATIONAL SEARCH REPORT | 欠陥検査方法及び欠陥検査装置 | Jan 31, 2019 |
- 15 United States
- 10 France
- 8 Japan
- 7 China
- 5 Korea
- 2 Other
Patent Owner(s)
Patent Owner | Address | |
---|---|---|
THE YOKOHAMA RUBBER CO LTD | JAPAN |
International Classification(s)

- 2018 Application Filing Year
- G01N Class
- 13274 Applications Filed
- 8380 Patents Issued To-Date
- 63.14 % Issued To-Date
Inventor(s)
Inventor Name | Address | # of filed Patents | Total Citations |
---|---|---|---|
Sugiura, Akihiko | Toyohashi, JP | 14 | 498 |
# of filed Patents : 14 Total Citations : 498 | |||
Tada, Hirotaro | Hiratsuka, JP | 7 | 12 |
# of filed Patents : 7 Total Citations : 12 |
Cited Art Landscape
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Patent Citation Ranking
- 0 Citation Count
- G01N Class
- 0 % this patent is cited more than
- 3 Age
Forward Cite Landscape
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Maintenance Fees
Fee | Large entity fee | small entity fee | micro entity fee | due date |
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3.5 Year Payment | $1600.00 | $800.00 | $400.00 | Oct 26, 2025 |
7.5 Year Payment | $3600.00 | $1800.00 | $900.00 | Oct 26, 2029 |
11.5 Year Payment | $7400.00 | $3700.00 | $1850.00 | Oct 26, 2033 |
Fee | Large entity fee | small entity fee | micro entity fee |
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Surcharge - 3.5 year - Late payment within 6 months | $160.00 | $80.00 | $40.00 |
Surcharge - 7.5 year - Late payment within 6 months | $160.00 | $80.00 | $40.00 |
Surcharge - 11.5 year - Late payment within 6 months | $160.00 | $80.00 | $40.00 |
Surcharge after expiration - Late payment is unavoidable | $700.00 | $350.00 | $175.00 |
Surcharge after expiration - Late payment is unintentional | $1,640.00 | $820.00 | $410.00 |
Full Text

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Jun 04, 2020 | P | Published | |
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Jul 25, 2018 | F | Filing | |
Jul 26, 2017 | PD | Priority Date |

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