Nanoscale dynamic mechanical analysis via atomic force microscopy (AFM-nDMA)

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United States of America

PATENT NO 11307220
APP PUB NO 20210239732A1
SERIAL NO

17234185

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Abstract

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An atomic-force-microscope-based apparatus and method including hardware and software, configured to collect, in a dynamic fashion, and analyze data representing mechanical properties of soft materials on a nanoscale, to map viscoelastic properties of a soft-material sample. The use of the apparatus as an addition to the existing atomic-force microscope device.

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Patent Owner(s)

Patent OwnerAddress
BRUKER NANO INC112 ROBIN HILL ROAD GOLETA CA 93117

International Classification(s)

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  • 2021 Application Filing Year
  • B82Y Class
  • 629 Applications Filed
  • 439 Patents Issued To-Date
  • 69.80 % Issued To-Date
Click to zoom InYear of Issuance% of Matters IssuedCumulative IssuancesYearly Issuances202120222023202420250255075100

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Osechinskiy, Sergey Goleta, US 10 16
Pittenger, Bede Goleta, US 12 33
Ruiter, Anthonius Goleta, US 7 12
Syed-Amanulla, Syed-Asif Minneapolis, US 5 8

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  • B82Y Class
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