Micrometer for measuring dimension of a conductive object
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United States of America Patent
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Mar 22, 2022
Grant Date -
Mar 17, 2022
app pub date -
Sep 11, 2020
filing date -
Sep 11, 2020
priority date (Note) -
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Abstract
A micrometer according to the present invention comprises: a frame of conductive material; an anvil of conductive material that is fixedly coupled to one end of the frame in an electrically insulated manner from the frame; a spindle of conductive material coupled to other end of the frame in such a way as to be moved back and forth along direction of the anvil in synchronization with rotation of a thimble while making electrical contact with the frame; and a controller configured to transmit a value for current gap between the anvil and the spindle to an external device as a measurement in case the anvil and the frame are electrically short-circuited. This configuration of the micrometer allows a measurement to be sent to the external device only in the case that a conductive object is necessarily mounted between the anvil and the spindle and electrically short-circuits them.
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