Speckled calibration artifact to calibrate metrology equipment

Number of patents in Portfolio can not be more than 2000

United States of America

PATENT NO 11269115
APP PUB NO 20210063604A1
SERIAL NO

16560823

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Abstract

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A speckled calibration artifact to calibrate metrology equipment is disclosed. A particular embodiment includes a geometric solid having a smooth outer surface of a solid base color; and a speckled contrasting color applied on the outer surface of the geometric solid in a randomly speckled pattern enabling portions of the solid base color and portions of the contrasting color to be visible on the smooth outer surface of the geometric solid.

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Patent Owner(s)

Patent OwnerAddress
PHOTOGAUGE INC640 MASONIC WAY #1119 BELMONT CA 94002

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Sharma, Sameer Alamo, US 95 1275
Subramanian, Sankara J Alamo, US 19 135
Thiruselvam, Iniyan Alamo, US 1 1
Xavier, Arunnelson Alamo, US 3 1

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