Inspection system and method for analysing defects
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United States of America Patent
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Feb 15, 2022
Grant Date -
May 2, 2019
app pub date -
Oct 25, 2018
filing date -
Oct 26, 2017
priority date (Note) -
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Abstract
The invention relates to a method for analysing defects in transformer laminations using an inspection system, and to an inspection system (24), wherein the inspection system comprises a detection unit (26), a conveyance device (27) and a processing device, wherein the detection unit includes an optical detecting device (31), wherein the conveyance device is used to continuously transport a plurality of transformer laminations (25) relative to the detecting device, wherein the detecting device is arranged transversely, preferably orthogonally, to a direction of movement of a transformer lamination, wherein a velocity of movement of a transformer lamination relative to the detecting device is measured via a measurement device (40) of the detection unit, wherein an image of a contour of a transformer lamination is captured with the detecting device, wherein images of a transformer lamination are assembled into a combined image of the transformer lamination via the processing device while considering the velocity of movement of the transformer lamination, wherein a shape of the transformer lamination is determined on the basis of the combined image via the processing device.
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