Phase-shift-based amplitude detector for a high-speed atomic force microscope
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United States of America Patent
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Feb 8, 2022
Grant Date -
Jun 10, 2021
app pub date -
Jul 23, 2019
filing date -
Jul 26, 2018
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Abstract
An atomic force microscope includes a cantilever operating in amplitude modulation mode. A controller determines the amplitude of the cantilever oscillation by processing a signal representative of the cantilever motion by square-rooting a signal having a value substantially equal to a sum of a square of the received signal and a squared and phase-shifted version of the received signal. The aforementioned processing, in some implementations is implemented using analog circuit components.
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