Surface sensitive atomic force microscope based infrared spectroscopy
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United States of America
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Jan 18, 2022
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Jul 9, 2020
app pub date -
Jul 9, 2018
filing date -
Jul 9, 2018
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Abstract
System and Methods may be provided for performing chemical spectroscopy on samples from the scale of nanometers with surface sensitivity even on very thick sample. In the method, a signal indicative of infrared absorption of the surface layer is constructed by illuminating the surface layer with a beam of infrared radiation and measuring a probe response comprising at least one of a resonance frequency shift and a phase shift of a resonance of a probe in response to infrared radiation absorbed by the surface layer.
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