System and method for x-ray absorption spectroscopy using a crystal analyzer and a plurality of detector elements
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United States of America
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Jan 4, 2022
Grant Date -
Nov 18, 2021
app pub date -
May 14, 2021
filing date -
May 14, 2021
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Abstract
An apparatus includes a crystal analyzer positioned relative to an x-ray source on a Rowland circle. The crystal analyzer includes crystal planes curved along at least one direction and configured to receive x-rays from the x-ray source and to disperse the received x-rays according to Bragg's law. The apparatus further includes a spatially resolving detector that includes a plurality of x-ray detection elements having a tunable first x-ray energy and/or a tunable second x-ray energy. The plurality of x-ray detection elements are configured to measure received dispersed x-rays having x-ray energies below the first x-ray energy while suppressing measurements above the first x-ray energy and/or to measure the received dispersed x-rays having x-ray energies above the second x-ray energy while suppressing measurements below the second x-ray energy.

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Patent Owner(s)
Patent Owner | Address | |
---|---|---|
SIGRAY INC | 5750 IMHOFF DRIVE SUITE I CONCORD CA 94520 |
International Classification(s)
Inventor(s)
Inventor Name | Address | # of filed Patents | Total Citations |
---|---|---|---|
Kirz, Janos | Berkeley, US | 51 | 1475 |
Lewis, Sylvia Jia Yun | San Francisco, US | 45 | 1447 |
Qiao, Ruimin | Berkeley, US | 3 | 13 |
Seshadri, Srivatsan | Pleasanton, US | 18 | 509 |
Yun, Wenbing | Walnut Creek, US | 99 | 3901 |
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