System and method for internal structural defect analysis using three-dimensional sensor data
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Nov 16, 2021
Grant Date -
Mar 9, 2017
app pub date -
Sep 9, 2015
filing date -
Sep 9, 2015
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
A method for structural analysis of an object includes generating scanned surface data of an object using a three-dimensional sensor and aligning a physical object model corresponding to the scanned surface data with a predetermined three-dimensional model of the object. The method also includes identifying an interference between a location of the aligned physical object model, optionally including any elastic deformation with an internal component within the three-dimensional model and generating an indicator of expected damage to the internal component.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully