Atomic force microscopy apparatus, methods, and applications
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United States of America Patent
Stats
-
Nov 16, 2021
Grant Date -
Jun 25, 2020
app pub date -
May 10, 2018
filing date -
May 10, 2017
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
Atomic force microscopy apparatus and method that enable observing charge generation transients with nanometer spatial resolution and nanosecond to picosecond time resolution, the timescale relevant for studying photo-generated charges in the world's highest efficiency photovoltaic films. The AFM apparatus includes an AFM, a light source for illumination of a sample operatively coupled to the AFM, a voltage source operatively coupled to the AFM, and a control circuitry operatively coupled to the light source and the voltage source. The AFM apparatus improves the time resolution and enables rapid acquisition of photocapacitance transients in a wide array of solar-energy-harvesting materials.
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International Classification(s)
- 2018 Application Filing Year
- G01Q Class
- 112 Applications Filed
- 93 Patents Issued To-Date
- 83.04 % Issued To-Date
Cited Art Landscape
Patent Citation Ranking
- 0 Citation Count
- G01Q Class
- 0 % this patent is cited more than
- 4 Age
Maintenance Fees
| Fee | Large entity fee | small entity fee | micro entity fee | due date |
|---|---|---|---|---|
| 3.5 Year Payment | $1600.00 | $800.00 | $400.00 | May 16, 2025 |
| 7.5 Year Payment | $3600.00 | $1800.00 | $900.00 | May 16, 2029 |
| 11.5 Year Payment | $7400.00 | $3700.00 | $1850.00 | May 16, 2033 |
