Film defect detection method and system
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United States of America Patent
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Sep 21, 2021
Grant Date -
Apr 2, 2020
app pub date -
Oct 1, 2019
filing date -
Oct 1, 2018
priority date (Note) -
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Abstract
The present specification provides a film defect detection system. The film defect detection system may comprise an image acquisition unit configured to acquire an image of a film in a manufacturing process of the film; a defect detection unit configured to detect defects in the film by analyzing the acquired image of the film, using a machine learning algorithm learned to detect a defect in advance, when receiving the acquired image of the film; and an information output unit configured to output information on the defects in the film detected by the defect detection unit.
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