Measurement apparatus of wavefront and polarization profile of vectorial optical fields
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United States of America Patent
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Jul 20, 2021
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app pub date -
May 6, 2019
filing date -
Jul 6, 2018
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Abstract
An apparatus measures the transverse profile of vectorial optical field beams, including both the phase and the polarization spatial profile. The apparatus contains a polarization separation module, a weak perturbation module, and a detection module. Characterizing the transverse profile of vector fields provides an optical metrology tool for both fundamental studies of vectorial optical fields and a wide spectrum of applications, including microscopy, surveillance, imaging, communication, material processing, and laser trapping.
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