Double edge triggered Mux-D scan flip-flop

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United States of America Patent

PATENT NO 11054470
APP PUB NO 20210194468A1
SERIAL NO

16725689

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Abstract

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A family of novel, low power, min-drive strength, double-edge triggered (DET) input data multiplexer (Mux-D) scan flip-flop (FF) is provided. The flip-flop takes the advantage of no state node in the slave to remove data inverters in a traditional DET FF to save power, without affecting the flip-flop functionality under coupling/glitch scenarios.

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Patent Owner(s)

Patent OwnerAddress
INTEL CORPORATION2200 MISSION COLLEGE BOULEVARD SANTA CLARA CA 95054

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Agarwal, Amit Hillsboro, US 218 3194
Hsu, Steven Lake Oswego, US 30 204
Krishnamurthy, Ram Portland, US 127 1277
Realov, Simeon Portland, US 18 56
Thaploo, Anupama Ambardar Folsom, US 1 0

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