Method and apparatus for generating measurement plan for measuring X-ray CT
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United States of America Patent
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Jun 15, 2021
Grant Date -
Sep 19, 2019
app pub date -
Mar 12, 2019
filing date -
Mar 19, 2018
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Abstract
When generating a measurement plan for measuring X-ray CT that performs X-ray irradiation while rotating a test object, and in doing so acquires projection image data, reconstructs volume data from the projection image data, and measures a targeted measurement location in the volume data, the present invention calculates required measurement accuracy and a measurement field of view range based on tolerance information included in CAD data of the test object and a measurement location on the test object defined by a measurement operator ahead of time, and automatically generates, from this information, an optimized measurement plan that minimizes the number of measurements.
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