Analyzing device, analytical device, analyzing method, and computer program product
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United States of America Patent
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Jun 1, 2021
Grant Date -
Mar 26, 2020
app pub date -
Sep 20, 2019
filing date -
Sep 21, 2018
priority date (Note) -
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Abstract
An analyzing device includes: a measurement data acquisition unit that acquires measurement data obtained by irradiating a plurality of irradiation positions on a sample with a laser beam and performing mass spectrometry on a sample component corresponding to each irradiation position; and an analysis unit that performs analysis of the measurement data by excluding a set of data corresponding to an excluded irradiation position among the plurality of irradiation positions each having a different irradiation portion from which a portion that has been already irradiated with the laser beam is excluded in an irradiation range irradiated when the laser beam is irradiated to each irradiation position.
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