Integrated circuit tester probe contact liner

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United States of America Patent

PATENT NO 11009545
APP PUB NO 20200209308A1
SERIAL NO

16816841

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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An integrated circuit (IC) device tester includes contact probes. A liner is formed upon the contact probes. The liner includes a matrix of metal particles and glass particles. The metal particles of the liner allow the contact probe to pass an electrical current through the liner. The glass particles of the liner prevent C4 material from adhering to the liner.

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Patent Owner(s)

Patent OwnerAddress
INTERNATIONAL BUSINESS MACHINES CORPORATIONNEW ORCHARD ROAD ARMONK NY 10504

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Arvin, Charles L Poughkeepsie, US 153 801
Audette, David M Colchester, US 78 1074
Conti, Dennis R Essex Junction, US 15 194
Erwin, Brian M Millbrook, US 35 124
Wagner, Grant Jericho, US 24 183

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