Frequency modulation detection for photo induced force microscopy

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United States of America Patent

PATENT NO 10955437
SERIAL NO

16482241

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An atomic force microscope and method for detecting photo-induced force using the atomic force microscope utilizes light from a photonic source at a tip-sample interface that results in photo-induced force gradient, which is detected by measuring a resonant frequency of a vibrational mode of a cantilever of the atomic force microscope.

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Patent Owner(s)

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MOLECULAR VISTA INC6840 VIA DEL ORO SUITE 110 SAN JOSE CA 95119

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Albrecht, Thomas R San Jose, US 111 2224

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