Scanning X-ray apparatus with full-field detector

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United States of America Patent

PATENT NO 10945690
APP PUB NO 20180177475A1
SERIAL NO

15738324

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Abstract

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An X-ray imaging apparatus with an interferometer (IF) and an X-ray detector (D). A footprint of the X-ray detector (D) is larger than a footprint of the interferometer (IF). The interferometer is moved in scan motion across the detector (D) whilst the detector (D) remains stationary. Preferably the detector is a 2D full field detector.

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Patent Owner(s)

Patent OwnerAddress
KONINKLIJKE PHILIPS N VHOLLAND IAN DEHO FINN EINDHOVEN NORTH BRABANT

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Koehler, Thomas Hamburg, DE 304 2127
Maack, Hanns-Ingo Norderstedt, DE 62 317
Martens, Gerhard Henstedt-Ulzburg, DE 45 949
Noel, Peter Benjamin Theodor Unterföhring, DE 5 45
Pfeiffer, Franz Josef Unterföhring, DE 4 7
Proksa, Roland Neu Wulmstorf, DE 167 1511
Van, Stevendaal Udo Ahrensburg, DE 35 504
Von, Teuffenbach Maximilian Hamburg, DE 3 20

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