X-ray fluorescence analysis method, X-ray fluorescence analysis program, and X-ray fluorescence spectrometer

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United States of America Patent

PATENT NO 10921267
SERIAL NO

16559063

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An X-ray fluorescence analysis method according to an FP method uses a predefined theoretical intensity formula in a standard sample theoretical intensity calculation step for obtaining a sensitivity constant and in an unknown sample theoretical intensity calculation step during iterative calculation. In the formula, only in an absorption term relating to absorption of X-rays, a mass fraction of each component is normalized so that a sum of the mass fractions of all components becomes 1.

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RIGAKU CORPORATION3-9-12 MATSUBARA-CHO AKISHIMA-SHI TOKYO 1968666

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Kataoka, Yoshiyuki Takatsuki, JP 32 265
Kawakyu, Kosuke Takatsuki, JP 3 30

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