In situ tribometer and methods of use

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United States of America Patent

PATENT NO 10908069
APP PUB NO 20170254740A1
SERIAL NO

15597318

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Abstract

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Techniques for determining a characteristic of a sample using an atomic force microscope including a cantilever having a probe attached thereto, including positioning the sample within a cell and sliding the probe over a sliding zone of the sample within the cell. Lateral and vertical deformations of the cantilever are detected using the atomic force microscope as the probe is slid over the sliding zone. One or more characteristics are determined based on the detected lateral deformations of the cantilever.

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Patent Owner(s)

Patent OwnerAddress
THE TRUSTEES OF THE UNIVERSITY OF PENNSYLVANIA3600 CIVIC CENTER BOULEVARD 9TH FLOOR PHILADELPHIA PA 19104

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Carpick, Robert W Philadelphia, US 10 36
Gosvami, Nitya Nand Philadelphia, US 2 8

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