Alignment of images of a calibration image using a pattern

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United States of America Patent

PATENT NO 10902642
APP PUB NO 20190266754A1
SERIAL NO

16343815

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Abstract

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In an example, two images of a printed calibration image are acquired using two measurement devices. The measurement devices are offset along an axis so that the two images correspond to two portions of the printed calibration image overlapping along the axis. The printed calibration image comprises a pattern extending across the printed calibration image in the direction of the axis, the pattern defining a shape so that in each image, a portion of the pattern appears as different from a straight line parallel to the axis. The two images are aligned using the two portions of pattern.

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Patent Owner(s)

Patent OwnerAddress
HP INDIGO B VSTARTBAAN 16 1187 XR AMSTELVEEN AMSTELVEEN

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Haim, Moshe Ness Ziona, IL 4 0
Kaminsky, Eli Ness Ziona, IL 1 0
Yedid, Am Tsafrir Ness Ziona, IL 13 12

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