Fall-back solution for uncertain regions in MRCAT images

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United States of America Patent

PATENT NO 10870017
APP PUB NO 20180071550A1
SERIAL NO

15559210

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Abstract

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The present invention teaches a method and system for computing an alternative electron density map of an examination volume. The processing system is configured to compute a first electron density map using a plurality of imaging data, compute a second electron density map, wherein the second electron density map is a simplified version of the first electron density map, and compute the alternative electron density map, using the first electron density map and the second electron density map.

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Patent Owner(s)

Patent OwnerAddress
KONINKLIJKE PHILIPS N VHOLLAND IAN DEHO FINN EINDHOVEN NORTH BRABANT

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Blaffert, Thomas Eindhoven, NL 28 365
Prevrhal, Sven Eindhoven, NL 23 322
Renisch, Steffen Eindhoven, NL 42 321
Schadewaldt, Nicole Eindhoven, NL 32 165
Schulz, Heinrich Eindhoven, NL 49 490

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