Apparatus and method for simultaneous ramsey vector magnetometry
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United States of America Patent
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Nov 17, 2020
Grant Date -
Jan 17, 2019
app pub date -
Jul 10, 2018
filing date -
Jul 11, 2017
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Abstract
The present disclosure relates to apparatuses and methods to utilize techniques to simultaneously measure Ramsey pulses on a plurality of axes of the magneto-optical defect center material with defect centers. When measuring simultaneously, there is potentially no relative sensitivity loss relative to scalar measurements. Therefore, Ramsey pulses on a plurality of axes of a magneto-optical defect material with defect centers are measured while bypassing the sensitivity loss incurred with sequential measurement techniques. The axes are interrogated simultaneously while allowing for isolation of the individual responses from the signal detected from the magneto-optical defect center material. In some embodiments, the system utilizes a special Ramsey pulse sequence pair or a ‘shifted magnetometry adapted cancellation’ (SMAC) pair to detect and measure the magnetic field acting on the system.
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