Waveform analytics for optimizing performance of a machine
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United States of America Patent
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Nov 17, 2020
Grant Date -
Aug 29, 2019
app pub date -
May 10, 2019
filing date -
Dec 30, 2015
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Abstract
An apparatus obtains waveforms representing measurements of a physical characteristic of a machine's operation and performance results of the machine corresponding respectively to the waveforms, each of the performance results being indicative of the machine's performance under conditions at which the measurement represented by the corresponding waveform was made. The apparatus calculates, for each of at least interval associated with each of the waveforms, an influence value that represents a degree of influence of the waveforms on the performance results over the interval.
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