Sample holder for holding a sample for use with an atomic force microscope
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United States of America Patent
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Nov 3, 2020
Grant Date -
Jun 23, 2016
app pub date -
Aug 6, 2014
filing date -
Aug 6, 2013
priority date (Note) -
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status (Latency Note)
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Abstract
The invention relates to a sample holder (1) for holding a sample, particularly for use with an atomic force microscope. According to the invention, the sample holder (1) comprises: preferably a flexible support (10) having an upper side (10a) and a lower side (10b) facing away from said upper side (10a), a first and a second holding member (100, 200), wherein each holding member (100, 200) comprises a first section (101, 201) that is preferably connected to the upper side (10a) of the flexible support (10), as well as an opposing second section (102, 202) forming a tip (103, 203) of the respective holding member (100, 200), such that the holding members (100, 200) are each movable from a first position, in which the tips (103, 203) are positioned adjacent to one another, into a second position, in which the tips (103, 203) are further apart from each other than in said first positions and are separated by a gap (G) for receiving at least a portion of the sample (S) to be held, and wherein said tips (103, 203) are designed to penetrate the sample (S) or to press against it so as to hold it when the sample (S) is received by said gap (G) and the holding members (100, 200) are moved back from the second positions into the first positions.
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