Deformation sensor comprising an ion-conductive polymer layer
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United States of America Patent
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Sep 29, 2020
Grant Date -
Jan 3, 2019
app pub date -
Dec 22, 2016
filing date -
Dec 25, 2015
priority date (Note) -
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status (Latency Note)
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Abstract
The invention provides a sensor capable of detecting deformation. The deformation sensor has a structure in which an ion-conductive polymer layer is sandwiched between soft electrodes, wherein non-uniform ion distribution is generated in the ion-conductive polymer layer by deformation, thereby generating a potential difference between the electrodes.
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International Classification(s)
- G01L:MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL ....
- H01B:CABLES; CONDUCTORS; INSULATORS; SELECTION OF MATER....
- B82B:NANO-STRUCTURES; MANUFACTURE OR TREATMENT THEREOF
- G01B:MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIME....
- G01D:MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VAR....
- C08K:USE OF INORGANIC OR NON-MACROMOLECULAR ORGANIC SUB....
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