Defect detection using ultrasound scan data
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United States of America Patent
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Sep 15, 2020
Grant Date -
Oct 18, 2018
app pub date -
Feb 28, 2018
filing date -
Apr 12, 2017
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Abstract
An automatic defect detection method for detecting a defect in an object comprises: obtaining ultrasound scan data of the object, dividing echo amplitude values of the data into a plurality of sub-sets; assessing each sub-set to determine whether any echo amplitude values resulted from a structure of interest; computing for each sub-set, using at least a representative position of the structure portion of the sub-set and of a neighboring sub-set, a preselected mathematical function which is directly or inversely proportional to a distance between the representative positions; identifying sub-sets having a computed value that does not meet a predetermined criterion as regions of the ultrasound scan data that require inspection; issuing a notification indicating whether or not a region requiring inspection has been found; and if a region requiring inspection been found, storing data identifying the region in a database.
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