Method for using a geometrical probe with a spindle of a machine tool, and machine tool configured to carry out such a method

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United States of America Patent

PATENT NO 10768604
APP PUB NO 20190056711A1
SERIAL NO

16101884

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Abstract

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A method for using a geometrical probe (5) with a spindle (3) of a machine tool (1), wherein a probe fetch waiting state of the machine tool (1), at least one temperature parameter related to a temperature of the spindle (3) of the machine tool (1) is determined by measuring at least one temperature value for the spindle (3), and time for fetching the geometrical probe (5) is determined depending on the at least one temperature parameter.

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Patent Owner(s)

Patent OwnerAddress
GF MACHINING SOLUTIONS AG2504 BIEL/BIENNE

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Besuchet, Jean-Philippe Neuchatel, CH 12 50
Meier, Jonas Bern, CH 2 2
Schneider, Kurt Ipsach, CH 22 195

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