System and a method for resolving a crystal structure of a crystal at atomic resolution by collecting X-ray diffraction images
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United States of America Patent
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Aug 25, 2020
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Dec 6, 2018
app pub date -
Oct 28, 2016
filing date -
Nov 24, 2015
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Abstract
A method and a system for resolving a crystal structure of a crystal at atomic resolution by collecting X-ray diffraction images. The method includes the steps: a) ejecting a droplet of fluid comprising single or multiple of crystal into an ultrasonic acoustic levitator; b) levitating the droplet of fluid with the crystal in the ultrasonic acoustic levitator; b) monitoring the position and the spinning of the droplet with a visualization apparatus; c) applying X-ray to the crystal, the X-ray stemming from an X-ray source; and d) detecting the X-ray diffraction images from the crystal irradiated by the X-ray source by an X-ray detector being capable to capture two dimensional diffraction patterns.
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