Non-local scanning probes for scanning probe microscopy

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United States of America Patent

PATENT NO 10739378
APP PUB NO 20190324055A1
SERIAL NO

16393367

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Abstract

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The system is configured for performing scanning electrochemical microscopy via non-local continuous line probes. The continuous line probes include an insulating probe substrate, an insulating layer, and a conductive band electrode. The system includes a sample stage for positioning a sample substrate to be imaged so as to enable contact with the insulting probe substrate at an angle ΘCLP. The continuous line probe is translated across the sample substrate and changes in the signal generated at the continuous line probe are identified to indicate the presence of features on the sample substrate. A plurality of scans are performed at different angles via rotating the sample stage or the continuous line probe, the results of which are combined and analyzed to produce an image of the sample substrate via compressed sensing reconstruction. The resulting image has comparable resolution to those produced via conventional scanning electrochemical microscopy processes, but in less scan time and with less complex scanning hardware.

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Patent Owner(s)

Patent OwnerAddress
THE TRUSTEES OF COLUMBIA UNIVERSITY IN THE CITY OF NEW YORK412 LOW MEMORIAL LIBRARY 535 WEST 116TH STREET NEW YORK NY 10027

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Dorfi, Anna E New York, US 1 0
Esposito, Daniel Vincent New York, US 2 1
Kuo, Han-wen New York, US 5 7
O'Neil, Glen Montclair, US 1 0
Wright, John New York, US 87 1871

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