Removable test and diagnostics circuit
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United States of America Patent
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Jun 16, 2020
Grant Date -
Jun 29, 2017
app pub date -
Jul 31, 2014
filing date -
Jul 31, 2014
priority date (Note) -
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Abstract
A test and diagnostics circuit, methods and systems are described. An example test and diagnostics circuit includes a controller and a power monitor coupled to the controller. A load switch on the test and diagnostics circuit selectably implements a load from among multiple load values to test a computing and/or data storage system. The test and diagnostics circuit includes circuitry connecting the controller, the power monitor and the load switch to receive a test enable signal from a non-dedicated pin in a non-volatile dual inline memory module (NV-DIMM) slot to implement a test operation on the system.
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