Semiconductor substrate

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United States of America Patent

PATENT NO 10680068
SERIAL NO

16319053

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Abstract

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A technique related to a bonded semiconductor substrate capable of reducing an interface resistance is provided. The semiconductor substrate comprises a single-crystalline SiC substrate and a polycrystalline SiC substrate. The single-crystalline SIC substrate and the polycrystalline SiC substrate are bonded. A bonded region of the single-crystalline SiC substrate and the polycrystalline SiC substrate contains 1×1021 (atoms/cm3) or more of particular atoms.

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Patent Owner(s)

Patent OwnerAddress
SICOXS CORPORATION5-11-3 SHIMBASHI MINATO-KU TOKYO 105-0004

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Imaoka, Ko Kariya, JP 7 36
Minami, Akiyuki Tokyo, JP 13 67
Murasaki, Takanori Kariya, JP 17 65
Shimo, Toshihisa Kariya, JP 47 199
Uchida, Hidetsugu Tokyo, JP 20 158

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