Noise measurement for integrated circuit device with on-device test signal up-conversion
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United States of America Patent
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Jun 2, 2020
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N/A
app pub date -
Apr 11, 2019
filing date -
Apr 11, 2019
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Abstract
Noise test systems, methods, and circuitries are provided for determining a noise characteristic of a receiver. In one example, an integrated circuit device includes an active RF receiver element configured to process a radio frequency (RF) signal to generate a receiver signal; an up-conversion mixer configured to up-convert a test signal to generate an RF test signal; an attenuator configured to selectively adjust a power of the RF test signal to generate adjusted RF test signals; and a coupler configured to couple the adjusted RF test signals to an input of the active RF receiver element. In another example, instead of or in addition to the attenuator, the integrated circuit device includes first, second, and third power sensors configured to measure a power of the test signal, the RF test signal, and the receiver signal, respectively. The power measurements are used to determine the noise characteristic.
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