Backscatter characterization using interlinearly adaptive electromagnetic X-ray scanning
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
May 19, 2020
Grant Date -
Sep 6, 2018
app pub date -
Sep 7, 2016
filing date -
Sep 10, 2015
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
Methods and an x-ray source for sweeping an x-ray beam across an object of inspection. A beam of electrons is emitted by a cathode, while a sweep controller applies a signal to a beam controller in a prescribed path on an anode, thereby causing an x-ray beam to be emitted from an aperture disposed at one apex of a snout of variable length. The aperture may be a Rommel aperture that allows for forming a scanning x-ray of desired size and flux independently of the angle at which the beam is emitted. Scanning rate may be varied during the course of a scan. Multiple x-ray beams may be formed simultaneously, where one beam is inside a conveyance while the other is outside the conveyance, for example.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully