Spatially self-similar patterned illumination for depth imaging
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United States of America Patent
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Issued Date -
Oct 3, 2019
app pub date -
Apr 8, 2019
filing date -
Mar 10, 2014
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Abstract
Methods, systems, and devices involving patterned radiation are provided in accordance with various embodiments. Some embodiments include a device for projecting pattern radiation. Some embodiments include a method for estimating coordinates of a location on an object in a 3D scene. Some embodiments include a system for estimating the coordinates of a location on an object in a 3D scene. A variety of radiation patterns are provided in accordance with various embodiments. Some embodiments may relate to the use of patterned illumination to identify the angular information that may be utilized to measure depth by triangulation.
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