X-ray imaging condition modification method and x-ray system

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United States of America Patent

PATENT NO 10610188
APP PUB NO 20180199907A1
SERIAL NO

15617527

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Abstract

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An x-ray imaging condition modification method includes modifying a first imaging condition to a second imaging condition by changing a value of at least one parameter among parameters included in the first imaging condition to an arbitrary value, and changing values of remaining parameters that are parameters other than the at least one parameter using the arbitrary value and an approximate function.

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Patent Owner(s)

Patent OwnerAddress
HATAKEYAMA NORIHITOOSAKA

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Hatakeyama, Norihito Osaka, JP 3 6

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