Survey system

Number of patents in Portfolio can not be more than 2000

United States of America

PATENT NO 10591290
SERIAL NO

15619079

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Importance

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Abstract

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Provided is a survey system capable of acquiring point group data of a three-dimensional object desired to be measured without complicated setting. A survey system includes a surveying instrument including a tracking section that tracks a target by emitting tracking light and receiving the tracking light reflected on the target, and a scanner that rotates horizontally and integrally with the surveying instrument and performs scanning around a single axis in a vertical direction, and the scanner and the tracking section are offset in the horizontal direction. Therefore, a scanning line (SL) does not match the target, and is always controlled around the target.

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Patent Owner(s)

Patent OwnerAddress
TOPCON CORPORATION75-1 HASUNUMA-CHO ITABASHI-KU TOKYO 1748580

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Nishita, Nobuyuki Tokyo, JP 82 369
Yoshino, Kenichiro Tokyo, JP 16 262

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