Multi-level air gap formation in dual-damascene structure

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United States of America

PATENT NO 10586733
APP PUB NO 20190157140A1
SERIAL NO

16237886

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Abstract

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An upper layer is formed in a first interlayer dielectric (ILD) layer. The upper layer comprises a plurality of metal interconnects and one or more upper layer air gaps positioned between adjacent metal interconnects. A lower layer is formed in the first ILD layer. The lower layer comprises one or more vias, and one or more lower air gaps positioned between adjacent vias. The upper layer and the lower layer are formed in accordance with a dual-damascene process.

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Patent Owner(s)

Patent OwnerAddress
INTERNATIONAL BUSINESS MACHINES CORPORATIONNEW ORCHARD ROAD ARMONK NY 10504

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Conti, Richard A Altamont, US 73 2747
Dechene, Jessica Watervliet, US 20 97
Fan, Susan S Cohoes, US 8 62
Nguyen, Son V Schenectady, US 171 8962
Shearer, Jeffrey C Albany, US 27 204

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