Wide range compensation of low frequency response passive probe

Number of patents in Portfolio can not be more than 2000

United States of America

PATENT NO 10585118
APP PUB NO 20180328961A1
SERIAL NO

15721604

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Abstract

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Disclosed is a test and measurement probe. The test and measurement probe includes a probe tip to connect to a Device Under Test (DUT). The probe tip includes a Resistor Capacitor (RC) probe tip network coupled to a test signal channel. The test and measurement probe also includes at least one variable resistor coupled to the test signal channel. The at least one variable resistor is set to provide an adjustable resistance to compensate for frequency variation in the RC probe tip network.

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Patent Owner(s)

Patent OwnerAddress
TEKTRONIX INC14150 SW KARL BRAUN DRIVE P O BOX 500 M/S 50-LAW BEAVERTON OR 97077

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Booman, Richard A Lake Oswego, US 29 109
Mende, Michael J Portland, US 35 210
Wilburn, Wayne M Hillsboro, US 2 5

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