Sample holder

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United States of America

PATENT NO 10508999
SERIAL NO

15926079

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Abstract

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When conducting an analysis of a sample using an X-ray fluorescence spectrometer, a user allows a sample holder to hold the sample such that the sample is sandwiched between a first film and a second film, and mounts the sample holder in this state to the spectrometer. When conducting an analysis of the sample using a Fourier transform infrared spectrometer, the user allows the sample holder to hold the sample such that the sample is not sandwiched between the first film and the second film, and mounts the sample holder in this state to the spectrometer.

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Patent Owner(s)

Patent OwnerAddress
SHIMADZU CORPORATION1 NISHINOKYO KUWABARA-CHO NAKAGYO-KU KYOTO-SHI KYOTO 604-8511

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Furukawa, Hiroaki Kyoto, JP 51 316

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