Array substrate and testing method and manufacturing method thereof

Number of patents in Portfolio can not be more than 2000

United States of America Patent

PATENT NO 10490109
APP PUB NO 20150325159A1
SERIAL NO

14404180

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Abstract

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An array substrate, a testing method and a manufacturing method of the array substrate are disclosed. The array substrate comprises a first test line (3), a second test line (4), and first data lines (1) and second data lines (2) that are disposed alternately. The first data lines (1) are directly connected to the first test line (3), and the second data lines (2) are connected to the second test line (4) through switch elements (7); or, the second data lines (2) are directly connected to the second test line (4), and the first data lines (1) are connected to the first test line (3) through switch elements (7). With the array substrate, charges in the display region can be avoided from being transferred to a test line, thereby decreasing the accumulation of static electricity, and enhancing reliability of the short bar region.

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Patent Owner(s)

Patent OwnerAddress
BOE TECHNOLOGY GROUP CO LTD100015 NO 10 JIUXIANQIAO ROAD BEIJING CHAOYANG DISTRICT BEIJING CITY BEIJING CITY 100015
BEIJING BOE DISPLAY TECHNOLOGY CO LTDNO 118 JINGHAI 1ST ROAD BEIJING ECONOMIC AND TECHNOLOGICAL DEVELOPMENT ZONE DAXING DISTRICT BEIJING 100176 BEIJING CITY BEIJING CITY 100176

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Bai, Jinchao Beijing, CN 32 53
Ding, Xiangqian Beijing, CN 30 37
Guo, Zongjie Beijing, CN 23 35
Li, Liangliang Beijing, CN 71 97
Liu, Yao Beijing, CN 181 522

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