X-ray beam intensity monitoring device and X-ray inspection

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United States of America Patent

PATENT NO 10466372
APP PUB NO 20160187502A1
SERIAL NO

14981953

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Abstract

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The present invention discloses an X-ray beam intensity monitoring device and an X-ray inspection system. The X-ray beam intensity monitoring device comprises an intensity detecting module and a data processing module, wherein the intensity detecting module is adopted to be irradiated by the X-ray beam and send a detecting signal, the data processing module is coupled with the intensity detecting module to receive the detecting signal and output an X-ray beam intensity monitoring signal, wherein the X-ray beam intensity monitoring signal includes a dose monitoring signal for the X-ray beam and a brightness correction signal for correcting signal values of the X-ray beam. The X-ray beam intensity monitoring device can simultaneously perform dose monitoring and brightness monitoring, thereby improving the service efficiency of the X-ray beam intensity monitoring device. Moreover, the monitoring result of the X-ray beam intensity can be more accurate and reliable.

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Patent Owner(s)

Patent OwnerAddress
TSINGHUA UNIVERSITY100084 NO 1 TSINGHUA YUAN BEIJING HAIDIAN DISTRICT BEIJING CITY BEIJING CITY 100084
NUCTECH COMPANY LIMITED100084 BEIJING CITY HAIDIAN DISTRICT SHUANGQING ROAD WITH PARTY BUILDING A BLOCK 2 LAYER MUNICIPAL DISTRICT BEIJING CITY 100084

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
He, Huishao Beijing, CN 15 36
Kang, Kejun Beijing, CN 78 1276
Li, Shuwei Beijing, CN 31 693
Li, Yuanjing Beijing, CN 274 2040
Li, Yulan Beijing, CN 51 188
Liu, Yaohong Beijing, CN 109 597
Liu, Yinong Beijing, CN 148 1555
Zhang, Qingjun Beijing, CN 96 360
Zhao, Xiaolin Beijing, CN 6 1
Zhao, Ziran Beijing, CN 241 1415
Zhu, Weibin Beijing, CN 19 201

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