Mass spectrometry based multi-parametric particle analyzer
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United States of America Patent
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Oct 8, 2019
Grant Date -
Jun 27, 2019
app pub date -
Dec 21, 2018
filing date -
Mar 25, 2004
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
An analytical instrument has a sample introduction system for generating a stream of particles from a sample. An ionization system atomizes and ionizes particles in the stream as they are received. The instrument has an ion pretreatment system and a mass analyzer. The ion pretreatment system is adapted to transport ions generated by the ionization system to the mass analyzer. The mass analyzer is adapted measure the amount of at least one element in individual particles from the stream by performing mass analysis on the ions from the atomized particles. The instrument can be adapted to measure the amount of many different tags, for example at least five different tags, at the same time to facilitate multi-parametric analysis of cells and other particles.
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Patent Citation Ranking
- 1 Citation Count
- H01J Class
- 40.21 % this patent is cited more than
- 6 Age
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|---|---|---|---|---|
| 7.5 Year Payment | $3600.00 | $1800.00 | $900.00 | Apr 8, 2027 |
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