Re-filters for PIM measurements and a test bench utilizing the same
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United States of America Patent
Stats
-
Sep 3, 2019
Grant Date -
Nov 29, 2018
app pub date -
Aug 2, 2018
filing date -
Feb 5, 2016
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
A PIM test bench including a first duplexer, having a first port connected via a first filter to a third port and a second port connected via a second filter to the third port. The first port is fed by signal sources providing RF signals at first and second frequencies. A spectrum analyzer is connected to the second port. A device under test is connected between said third port and a third port of a second duplexer. Each of the first and second ports of the second duplexer is connected to a PIM optimized load and/or a standard load. The second duplexer is preferably identical to the first duplexer. For minimizing self-intermodulation, at least the first duplexer comprises at least one filter component and a metal housing. The housing further includes a monolithic metal body and a metal cover capacitively coupled to the body without any galvanic contact.
First Claim
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Family
International Classification(s)
- 2018 Application Filing Year
- H01P Class
- 747 Applications Filed
- 617 Patents Issued To-Date
- 82.60 % Issued To-Date
Cited Art Landscape
Patent Citation Ranking
- 3 Citation Count
- H01P Class
- 40.34 % this patent is cited more than
- 6 Age
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