Orthogonal field probes

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United States of America Patent

PATENT NO 10401389
APP PUB NO 20170219630A1
SERIAL NO

15423191

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Abstract

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Provided herein are electric and magnetic field probes for measuring and mapping distributions of such fields on, for example, circuits, antennas and materials.

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Patent Owner(s)

Patent OwnerAddress
VDW DESIGN LLC18 PELHAM CT MADISON WI 53713

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
van, der Weide Daniel Warren Madison, US 41 1379

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