Processing platform with metric mapping for interoperability of multiple distinct models
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United States of America Patent
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Aug 6, 2019
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N/A
app pub date -
Dec 21, 2016
filing date -
Dec 21, 2016
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Abstract
An apparatus in one embodiment comprises a processing platform comprising one or more processing devices. The processing platform implements a database configured to store metric and level information for each of a plurality of models, and a metric mapper adapted to interface with the database. The metric mapper is configured to utilize the metric and level information stored in the database to establish an association between a first metric characterizing at least one of a workload and a resource in accordance with a first one of the models and a second metric characterizing at least one of a workload and a resource in accordance with a second one of the models. The established association is illustratively applied to relate service requirements specified at least in part using the first metric of the first model to service capabilities specified at least in part using the second metric of the second model.
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