Software inspection apparatus

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United States of America Patent

PATENT NO 10372584
APP PUB NO 20170364432A1
SERIAL NO

15543101

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Abstract

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While the effectiveness of a model inspection method as a means for detecting software defects is known, large-scale software cannot be handled due to great amounts of calculation required for inspection. According to the present invention, after a model inspection problem of software is attributed to be a satisfiability determination problem, the problem is converted to a type that can be solved by a solver used for solving a notification optimization problem having constrained conditions, and the satisfiability is determined in a numerically analytical manner.

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Patent Owner(s)

Patent OwnerAddress
HITACHI LTDTOKYO

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Nishi, Masataka Tokyo, JP 19 184

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