Method and x-ray apparatus for interferometric 2D x-ray imaging
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United States of America Patent
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Jul 30, 2019
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Sep 14, 2017
app pub date -
Mar 13, 2017
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Mar 11, 2016
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Abstract
A method and an x-ray apparatus for interferometric 2D x-ray imaging, use a Talbot-Lau interferometer having at least one phase grating and an analysis grating for producing 2D images of an object to be examined using a phase stepping method. A stepwise readout of a detector is carried out continuously at a multiplicity of the phase positions of an interference pattern. Time sequences of readout interval data records which overlap in time are extracted from the readout data records, and at least one result image data record is calculated from an absorption image and/or a phase-contrast image and/or a dark-field image from each readout interval data record.
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