Electrical inspection method for solar cells
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United States of America Patent
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Jul 23, 2019
Grant Date -
Mar 8, 2018
app pub date -
Sep 7, 2016
filing date -
Sep 7, 2016
priority date (Note) -
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Abstract
The present invention discloses an electrical inspection method for solar cells, comprising steps of supplying a voltage and a current to a solar cell for stimulating the solar cell and giving a ray of light; filtering the light to give a ray of light having a predetermined wavelength; and measuring an optical power value of the light having a predetermined wavelength. The electrical inspection method adopts a low-cost apparatus to replace the solar simulators according to the prior art. In addition to saving costly equipment, filter adjustment, and the maintenance fee for replacing lamps, the defect inspection flow for solar cells can be further integrated and hence improving the efficiency.
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