Deformation amount measuring method, program, server device, and system
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United States of America Patent
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May 21, 2019
Grant Date -
Sep 27, 2018
app pub date -
Sep 12, 2016
filing date -
Sep 16, 2015
priority date (Note) -
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status (Latency Note)
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Abstract
At least one aspect of the present disclosure directs to a deformation amount measuring method is a method in which a sheet (101) is used that includes a first layer portion (111) having a first pattern (121) that includes a plurality of line drawings extending in a first direction, and a second layer portion (112) overlaid on the first layer portion (111) and having a second pattern (122) that includes a plurality of line drawings extending in a second direction different than the first direction. The method includes the steps of acquiring, from the sheet (101) that has been disposed on a measurement subject, post-deformation image data corresponding to a post-deformation image including a post-deformation moire produced as a result of a post-deformation first pattern (121) and second pattern (122) being overlaid and finding an amount of deformation of the measurement subject on the basis of the post-deformation image data.
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